A low energy beamline has been designed for the TwinEBIS setup. The beamline will be used to transport ions extracted from the electron beam ion source into an accelerating radio frequency quadrupole or into secondary devices, like a time of flight-mass spectrometer, attached to the beamline via a fast three way 20° ion switchyard. Optional injection of ions from an external source into the electron beam ion source is foreseen. In this article the general layout of the beamline is presented and supported with simulations of the ion-optical matching. Furthermore, the switchyard and gridded electrostatic lenses, chosen as the main focusing elements, have been simulated to assess their impact on the beam quality and the dynamics of secondary electrons emitted by the gridded lenses. In addition, the beamline includes general diagnostic devices, including a bidirectional pepperpot beam profiler. An overview of the diagnostic elements is given.

A low energy ion beamline for TwinEBIS / Pahl, H.; Bencini, V.; Breitenfeldt, M.; Granadeiro Costa, A. R.; Pikin, A.; Pitters, J.; Wenander, F.. - In: JOURNAL OF INSTRUMENTATION. - ISSN 1748-0221. - (2018).

A low energy ion beamline for TwinEBIS

V. Bencini
Investigation
;
2018

Abstract

A low energy beamline has been designed for the TwinEBIS setup. The beamline will be used to transport ions extracted from the electron beam ion source into an accelerating radio frequency quadrupole or into secondary devices, like a time of flight-mass spectrometer, attached to the beamline via a fast three way 20° ion switchyard. Optional injection of ions from an external source into the electron beam ion source is foreseen. In this article the general layout of the beamline is presented and supported with simulations of the ion-optical matching. Furthermore, the switchyard and gridded electrostatic lenses, chosen as the main focusing elements, have been simulated to assess their impact on the beam quality and the dynamics of secondary electrons emitted by the gridded lenses. In addition, the beamline includes general diagnostic devices, including a bidirectional pepperpot beam profiler. An overview of the diagnostic elements is given.
2018
Accelerator modelling and simulations (multi-particle dynamics; single-particle dy- namics); Beam Optics; Beam-line instrumentation (beam position and profile monitors; beam- intensity monitors; bunch length monitors); Ion sources (positive ions, negative ions, electron cyclotron resonance (ECR), electron beam (EBIS))
01 Pubblicazione su rivista::01a Articolo in rivista
A low energy ion beamline for TwinEBIS / Pahl, H.; Bencini, V.; Breitenfeldt, M.; Granadeiro Costa, A. R.; Pikin, A.; Pitters, J.; Wenander, F.. - In: JOURNAL OF INSTRUMENTATION. - ISSN 1748-0221. - (2018).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1186592
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